Scanning electron microscope (SEM) from Zeiss Group, Germany, model EVO® LS 15. The SEM is an instrument for investigating the surface topography of solids. The model has the advantage of high image resolution and versatility when examining a variety of sample types, including conductive and non-conductive materials. Analytical capabilities include energy dispersive X-ray spectroscopy (EDS/EDX).
Instrument specifications:
Accessories:
For further information, please contact:
Dr Eng. Vitalii Demeshkant
Senior technician
71 320-5888
